Benchtop WDXRF Analysis

When analysis of a single element is all that is required, the FSE configuration provides a value-engineered solution that is easy on the budget while maintaining the same precision as more expensive units.  While lacking the flexibility to be used on multiple elements, the fixed single element analyzer performs at the same high level of precision and provides accurate results targeted to single element analysis.

Dual Analysis is a good solution for customers targeted two known elements and provides an excellent solution at the highest levels of precision attainable.  While limited to two elements, the dual element analyzer gives the same accurate and reliable results that PortaSpec® products are known for worldwide.

PortaSpec® MES is the most versatile and flexible of the  PortaSpec® family of WDXRF analyzers. The  MES Analyzer is capable of performing multi-element sequential analysis in the range of Titanium to Uranium and is ideal for measuring coating weights of both chrome and titanium pretreatment and providing the flexibility to transition from one element to other elements at the touch of a button.

Cianflone’s benchtop PortaSpec® MES Analyzer contains a rotating goniometer that allows the user to analyze up to five elements and can be preset sequentially one at a time. An easy load two-position sample holder is an integrated part of the analyzer.  The PortaSpec® MES Analyzer is configured for analyzing liquids, powders, solids, and thin films. Analysis speed is increased by being able to change samples at the open end of the holder while the other preloaded sample is being analyzed.